Lanthanum Aluminate Substrate
Sim. Verneuill grown
Materials properties
| Structure formula: |
LaAlO3 |
|
| State: |
monocrystalline |
|
| Crystal structure: |
rhombohedrial
cubic
|
a = 5.377 Å
a = 60.13°a = 3.821 Å |
| Phase transition: |
> 500° C |
|
| Density: |
6.51 g/cm3 |
|
| Melting point: |
2180°C |
|
| Coefficient of expansion: |
10 * 10-6/°C |
|
| Dielectrical constant (e ): |
20-25 |
|
Substrate properties
| Production method: |
sim. Verneuill grown (with minimum twins) |
| Orientation: |
(100) |
| Orientation accuracy: |
£ 0.5° |
| Standard size: |
10mm x 10mm x thickness 1mm or 0.5mm |
| Tolerance of length: |
± 0.10mm (typical better ± 0.05mm) |
| Tolerance of thickness: |
± 0.05mm |
| Parallelness: |
£ 0.02mm |
| Polishing: |
standard: one side |
| Flatness: |
l /2 |
| Roughness of surface: |
Rmax £ 15nm (average Ra = 3nm) |
| Scratches: |
none |
| Surface quality: |
with light microscope without defects |
Other sizes and specifications on request
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